Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7994037 | Gate dielectrics of different thickness in PMOS and NMOS transistors | Martin Trentzsch, Karsten Wieczorek | 2011-08-09 |
| 7223615 | High emissivity capacitor structure | — | 2007-05-29 |
| 7144782 | Simplified masking for asymmetric halo | — | 2006-12-05 |
| 6943569 | Method, system and apparatus to detect defects in semiconductor devices | Laura Pressley, David E. Brown, Travis R. Lewis, Paul R. Besser | 2005-09-13 |
| 6916716 | Asymmetric halo implants | Scott Goad, James C. Pattison | 2005-07-12 |
| 6806111 | Semiconductor component and method of manufacture | Mark B. Fuselier | 2004-10-19 |
| 6794256 | Method for asymmetric spacer formation | Mark B. Fuselier, S. Doug Ray, Chad Weintraub, James F. Buller | 2004-09-21 |
| 6593168 | Method and apparatus for accurate alignment of integrated circuit in flip-chip configuration | Travis D. Kirsch, Chris Wooten | 2003-07-15 |
| 6522776 | Method for automated determination of reticle tilt in a lithographic system | — | 2003-02-18 |
| 6401008 | Semiconductor wafer review system and method | Chris Wooten | 2002-06-04 |
| 6265314 | Wafer edge polish | Hang Thi Yen Black | 2001-07-24 |
| 6169960 | Method for determining the damage potential of the different types of wafer defects | — | 2001-01-02 |
| 6156580 | Semiconductor wafer analysis system and method | Chris Wooten | 2000-12-05 |