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Gate dielectrics of different thickness in PMOS and NMOS transistors |
Martin Trentzsch, Karsten Wieczorek |
2011-08-09 |
| 7223615 |
High emissivity capacitor structure |
— |
2007-05-29 |
| 7144782 |
Simplified masking for asymmetric halo |
— |
2006-12-05 |
| 6943569 |
Method, system and apparatus to detect defects in semiconductor devices |
Laura Pressley, David E. Brown, Travis R. Lewis, Paul R. Besser |
2005-09-13 |
| 6916716 |
Asymmetric halo implants |
Scott Goad, James C. Pattison |
2005-07-12 |
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Semiconductor component and method of manufacture |
Mark B. Fuselier |
2004-10-19 |
| 6794256 |
Method for asymmetric spacer formation |
Mark B. Fuselier, S. Doug Ray, Chad Weintraub, James F. Buller |
2004-09-21 |
| 6593168 |
Method and apparatus for accurate alignment of integrated circuit in flip-chip configuration |
Travis D. Kirsch, Chris Wooten |
2003-07-15 |
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Method for automated determination of reticle tilt in a lithographic system |
— |
2003-02-18 |
| 6401008 |
Semiconductor wafer review system and method |
Chris Wooten |
2002-06-04 |
| 6265314 |
Wafer edge polish |
Hang Thi Yen Black |
2001-07-24 |
| 6169960 |
Method for determining the damage potential of the different types of wafer defects |
— |
2001-01-02 |
| 6156580 |
Semiconductor wafer analysis system and method |
Chris Wooten |
2000-12-05 |