Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943569 | Method, system and apparatus to detect defects in semiconductor devices | David E. Brown, Travis R. Lewis, Edward E. Ehrichs, Paul R. Besser | 2005-09-13 |
| 6566886 | Method of detecting crystalline defects using sound waves | Terri A. Couteau, Michael J. Satterfield | 2003-05-20 |
| 6524869 | Method and apparatus for detecting ion implant induced defects | Michael J. Satterfield, Terri A. Couteau, Daniel E. Sutton, Bryon K. Hance, David M. Hendrix | 2003-02-25 |
| 5961791 | Process for fabricating a semiconductor device | Larry E. Frisa, Hak-Lay Chuang | 1999-10-05 |