KW

Karsten Wieczorek

AM AMD: 76 patents #54 of 9,279Top 1%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
Overall (All Time): #23,945 of 4,157,543Top 1%
78
Patents All Time

Issued Patents All Time

Showing 25 most recent of 78 patents

Patent #TitleCo-InventorsDate
8188871 Drive current adjustment for transistors by local gate engineering Manfred Horstmann, Patrick Press, Kerstin Ruttloff 2012-05-29
8097542 Etch stop layer of reduced thickness for patterning a dielectric material in a contact level of closely spaced transistors Manfred Horstmann, Peter Huebler, Kerstin Ruttloff 2012-01-17
8039338 Method for reducing defects of gate of CMOS devices during cleaning processes by modifying a parasitic PN junction Manfred Horstmann, Peter Javorka, Kerstin Ruttloff 2011-10-18
7994037 Gate dielectrics of different thickness in PMOS and NMOS transistors Martin Trentzsch, Edward E. Ehrichs 2011-08-09
7955937 Method for manufacturing semiconductor device comprising SOI transistors and bulk transistors Manfred Horstmann, Thomas Feudel, Thomas J. Heller, Jr. 2011-06-07
7745334 Technique for locally adapting transistor characteristics by using advanced laser/flash anneal techniques Patrick Press, Karla Romero, Martin Trentzsch, Thomas Feudel, Markus Lenski +1 more 2010-06-29
7494872 Field effect transistor having a doped gate electrode with reduced gate depletion and method of forming the transistor Thomas Feudel, Thorsten Kammler, Wolfgang Buchholtz 2009-02-24
7419867 CMOS gate structure comprising predoped semiconductor gate material with improved uniformity of dopant distribution and method of forming the structure Manfred Horstmann, Thomas Feudel 2008-09-02
7297994 Semiconductor device having a retrograde dopant profile in a channel region Manfred Horstmann, Rolf Stephan 2007-11-20
7238578 Method of forming a semiconductor structure comprising transistor elements with differently stressed channel regions Gert Burbach, Rolf Stephan, Manfred Horstmann 2007-07-03
7226859 Method of forming different silicide portions on different silicon-containing regions in a semiconductor device Manfred Horstmann, Rolf Stephan 2007-06-05
7217657 Semiconductor device having different metal silicide portions and method for fabricating the semiconductor device Manfred Horstmann, Rolf Stephan 2007-05-15
7192881 Method of forming sidewall spacer elements for a circuit element by increasing an etch selectivity Thorsten Kammler, Christoph Schwan 2007-03-20
7148145 Semiconductor device having T-shaped gate structure comprising in situ sidewall spacers and method of forming the semiconductor device Manfred Horstmann, Rolf Stephan 2006-12-12
7122410 Polysilicon line having a metal silicide region enabling linewidth scaling including forming a second metal silicide region on the substrate Thorsten Kammler, Matthias Schaller 2006-10-17
7115464 Semiconductor device having different metal-semiconductor portions formed in a semiconductor region and a method for fabricating the semiconductor device Rolf Stephan, Manfred Horstmann 2006-10-03
7067410 Method of forming a metal silicide Thorsten Kammler, Manfred Horstmann 2006-06-27
7060549 SRAM devices utilizing tensile-stressed strain films and methods for fabricating the same Mark Craig, Manfred Horstmann 2006-06-13
7041583 Method of removing features using an improved removal process in the fabrication of a semiconductor device Manfred Horstmann, Rolf Stephan 2006-05-09
6995027 Integrated semiconductor structure for reliability tests of dielectrics Rolf Geilenkeuser, Jörg Weidner 2006-02-07
6933620 Semiconductor component and method of manufacture Scott Lunning, Thorsten Kammler 2005-08-23
6911404 Transistor element having an anisotropic high-k gate dielectric Christian Radehaus 2005-06-28
6900111 Method of forming a thin oxide layer having improved reliability on a semiconductor surface Stephan Krügel, Falk Graetsch 2005-05-31
6881641 Semiconductor device having a retrograde dopant profile in a channel region and method for fabricating the same Manfred Horstmann, Rolf Stephan 2005-04-19
6875676 Methods for producing a highly doped electrode for a field effect transistor Falk Graetsch, Gunter Grasshoff 2005-04-05