Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8456224 | Compensation of operating time-related degradation of operating speed by a constant total die power mode | Maciej Wiatr, Richard Heller | 2013-06-04 |
| 7340360 | Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness | John H. Zhang, Kurt Taylor, Eugene Zhao, Amit P. Marathe, Joerg-Oliver Weidner | 2008-03-04 |
| 6995027 | Integrated semiconductor structure for reliability tests of dielectrics | Karsten Wieczorek, Jörg Weidner | 2006-02-07 |