KH

Kunihiko Hatsushika

IC Ibiden Co.: 3 patents #258 of 730Top 40%
TL Tokyo Electron Limited: 3 patents #2,069 of 5,567Top 40%
KT Kabushiki Kaisha Toshiba: 2 patents #9,982 of 21,451Top 50%
Overall (All Time): #1,542,845 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8456186 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method Kiyoshi Takekoshi, Hisatomi Hosaka, Junichi Hagihara, Takamasa Usui, Hisashi Kaneko +2 more 2013-06-04
7242206 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method Kiyoshi Takekoshi, Hisatomi Hosaka, Junichi Hagihara, Takamasa Usui, Hisashi Kaneko +2 more 2007-07-10
7091733 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method Kiyoshi Takekoshi, Hisatomi Hosaka, Junichi Hagihara, Takamasa Usui, Hisashi Kaneko +2 more 2006-08-15