Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8456186 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Hisatomi Hosaka, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2013-06-04 |
| 8120372 | Probe card for inspecting light receiving device | — | 2012-02-21 |
| 8101436 | Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive film | — | 2012-01-24 |
| 7716824 | Method of manufacturing a probe card | — | 2010-05-18 |
| 7621045 | Method of producing a probe with a trapezoidal contactor | Hisatomi Hosaka | 2009-11-24 |
| 7602203 | Probe and probe card | — | 2009-10-13 |
| 7319339 | Inspection apparatus to break the oxide of an electrode by fritting phenomenon | Shinji Iino, Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2008-01-15 |
| 7304489 | Inspection method and inspection apparatus | Shinji Iino, Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2007-12-04 |
| 7256592 | Probe with trapezoidal contractor and device based on application thereof, and method of producing them | Hisatomi Hosaka | 2007-08-14 |
| 7242206 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Hisatomi Hosaka, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2007-07-10 |
| 7221176 | Vacuum prober and vacuum probe method | Haruhiko Yoshioka, Shinjiro Watanabe | 2007-05-22 |
| 7091733 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Hisatomi Hosaka, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2006-08-15 |
| 7061259 | Inspection method and inspection apparatus | Shinji Iino, Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2006-06-13 |
| 6777967 | Inspection method and inspection apparatus | Shinji Iino, Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2004-08-17 |
| 6774621 | Inspection stage having a plurality of Z axes | — | 2004-08-10 |
| 6707310 | Needle load measuring method, needle load setting method and needle load detecting mechanism | — | 2004-03-16 |
| 6672876 | Probe card with pyramid shaped thin film contacts | — | 2004-01-06 |
| 6590381 | Contactor holding mechanism and automatic change mechanism for contactor | Shinji Iino, Junichi Hagihara | 2003-07-08 |
| 6583614 | Inspection stage and inspection apparatus having a plurality of Z axes | — | 2003-06-24 |
| 6501289 | Inspection stage including a plurality of Z shafts, and inspection apparatus | — | 2002-12-31 |
| 6359455 | Probing card | — | 2002-03-19 |
| 6024629 | Probe apparatus and a method for polishing a probe | — | 2000-02-15 |
| 5801545 | LCD testing apparatus | Tetsuji Ono, Hiromichi Fujihara | 1998-09-01 |
| 5691764 | Apparatus for examining target objects such as LCD panels | Shinji Iino, Itaru Iida | 1997-11-25 |
| 4941800 | Transfer apparatus for plate-like member | Hisashi Koike, Itaru Takao, Masaki Narushima | 1990-07-17 |