Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8456186 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Kiyoshi Takekoshi, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2013-06-04 |
| RE42637 | Probe card | Jun Mochizuki | 2011-08-23 |
| 7750655 | Multilayer substrate and probe card | Jun Mochizuki | 2010-07-06 |
| 7663386 | Probe card | — | 2010-02-16 |
| 7629806 | Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card | — | 2009-12-08 |
| 7621045 | Method of producing a probe with a trapezoidal contactor | Kiyoshi Takekoshi | 2009-11-24 |
| 7541820 | Probe card | Takashi Amemiya | 2009-06-02 |
| 7498827 | Probe card | Jun Mochizuki | 2009-03-03 |
| 7474110 | Probe card | Jun Mochizuki | 2009-01-06 |
| 7256592 | Probe with trapezoidal contractor and device based on application thereof, and method of producing them | Kiyoshi Takekoshi | 2007-08-14 |
| 7242206 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Kiyoshi Takekoshi, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2007-07-10 |
| 7091733 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Kiyoshi Takekoshi, Junichi Hagihara, Kunihiko Hatsushika, Takamasa Usui, Hisashi Kaneko +2 more | 2006-08-15 |
| 5798651 | Probe system | Tsuyoshi Aruga, Wataru Mochizuki, Shuji Akiyama, Yuichi Abe | 1998-08-25 |