SA

Shuji Akiyama

TL Tokyo Electron Limited: 25 patents #181 of 5,567Top 4%
NC Nippon Electric Glass Co.: 5 patents #78 of 437Top 20%
MK Murata Kikai: 2 patents #175 of 454Top 40%
NA Nabtesco: 2 patents #85 of 320Top 30%
Samsung: 1 patents #49,284 of 75,807Top 70%
MC Miraial Co.: 1 patents #22 of 38Top 60%
OL Olympus: 1 patents #2,078 of 3,097Top 70%
MC Minebea Co.: 1 patents #400 of 736Top 55%
📍 Yonago, JP: #4 of 127 inventorsTop 4%
Overall (All Time): #112,676 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDate
11511461 Glass film manufacturing method Kaoru Mitsugi, Yoshinori Hasegawa 2022-11-29
11515175 Wafer inspection apparatus Hiroki Hosaka 2022-11-29
11459264 Method for producing glass film Hiroki Mori, Koichi Mori, Yasuhiro Uemura, Naoyuki Matsumoto 2022-10-04
10889519 Method for manufacturing glass roll Naohiro Ikai, Kaoru Mitsugi, Hiroki Mori, Koichi Mori, Yasuhiro Uemura 2021-01-12
10823778 Inspection system Takeo Saito, Eiichi Matsuzawa 2020-11-03
10766804 Glass film production method Kaoru Mitsugi, Naohiro Ikai 2020-09-08
9914590 Workpiece conveyance method and workpiece conveyance device Kaoru Mitsugi, Koji Nishijima 2018-03-13
9684014 Prober for inspecting semiconductor devices formed on semiconductor wafer Kazuya Yano, Isamu Inomata 2017-06-20
9494187 Fluid bearing, motor and polygon mirror scanner motor Katsunori Sakuragi, Michiharu Yamamoto 2016-11-15
9383389 Prober and needle-tip polishing device for probe card Kazuya Yano 2016-07-05
8866503 Wafer chuck inclination correcting method and probe apparatus Kazunari Ishii, Toshihiko Iijima 2014-10-21
8310261 Probing apparatus and probing method Hiroki Hosaka, Tadashi Obikane 2012-11-13
8041097 Confocal microscope Akihiro Kitahara 2011-10-18
8007389 Heavy object turning apparatus Toshihiro Yudate, Hiroshi Yamada, Nobuhiro Kameda 2011-08-30
7887280 Processing apparatus Hiroki Hosaka, Tadashi Obikane 2011-02-15
7794350 Turning device for heavy object Toshihiro Yudate, Hiroshi Yamada, Nobuhiro Kameda 2010-09-14
7741837 Probe apparatus Tadashi Obikane 2010-06-22
7701236 Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer Tadashi Obikane, Masaru Suzuki, Yasuhito Yamamoto, Kazuya Yano, Yuji Asakawa +6 more 2010-04-20
D607424 Wafer carrying-in/out apparatus Hiroki Hosaka, Tadashi Obikane 2010-01-05
D602882 Wafer carrying-in/out apparatus Hiroki Hosaka, Tadashi Obikane 2009-10-27
7583096 Probing apparatus and probing method Hiroki Hosaka, Tadashi Obikane 2009-09-01
D592230 Wafer carrying-in/out machine Hiroki Hosaka, Tadashi Obikane 2009-05-12
7457680 Conveyance method for transporting objects Toshihiko Iijima, Hiroki Hosaka 2008-11-25
7283890 Work convey system, unmanned convey vehicle system, unmanned convey vehicle, and work convey method Toshihiko Iijima, Hiroki Hosaka, Takashi Nakao 2007-10-16
7153079 Automated guided vehicle Ken Miyano, Takahiko Murayama, Takashi Nakao 2006-12-26