KY

Kazuya Yano

SH Sumitomo Electric Hardmetal: 10 patents #44 of 278Top 20%
TL Tokyo Electron Limited: 9 patents #845 of 5,567Top 20%
NC Nippon Light Metal Company: 1 patents #203 of 499Top 45%
SN Seiko Npc: 1 patents #6 of 25Top 25%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
Overall (All Time): #194,473 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
D910093 Drilling tool Machiko Abe, Hiroyuki Shimada 2021-02-09
D888786 Drilling tool Machiko Abe, Hiroyuki Shimada 2020-06-30
D882653 Drilling tool Machiko Abe, Hiroyuki Shimada 2020-04-28
D857069 Drilling tool Machiko Abe, Hiroyuki Shimada 2019-08-20
D856387 Drilling tool Machiko Abe, Hiroyuki Shimada 2019-08-13
D847231 Drilling tool Machiko Abe, Hiroyuki Shimada 2019-04-30
D844683 Drilling tool 2019-04-02
D844034 Drilling tool 2019-03-26
D794691 Drilling tool 2017-08-15
9707629 Cutting tool Yoshinori Tanigawa, Yoshikazu Yamashita, Hiroyuki Shimada, Kazuo Nakamae 2017-07-18
9684014 Prober for inspecting semiconductor devices formed on semiconductor wafer Shuji Akiyama, Isamu Inomata 2017-06-20
9523711 Probe apparatus and wafer mounting table for probe apparatus Eiji Hayashi, Munetoshi Nagasaka 2016-12-20
9383389 Prober and needle-tip polishing device for probe card Shuji Akiyama 2016-07-05
9261553 Probe apparatus Eiichi Shinohara, Munetoshi Nagasaka, Isamu Inomata, Yoshiyasu Kato 2016-02-16
8726748 Probe apparatus and substrate transfer method Tadashi Obikane, Hiroshi Yamada, Masaru Suzuki, Yasuhito Yamamoto 2014-05-20
8113084 Mounting device Hiroshi Shimoyama, Masaru Suzuki 2012-02-14
8071123 Process for producing edible orally administered agent of laminate film form and compression bonding apparatus Yasuo Hayashi, Tsutomu Awamura, Kazuyoshi Sudeji 2011-12-06
7963513 Mounting device Hiroshi Shimoyama, Masaru Suzuki 2011-06-21
7940065 Probe apparatus and method for measuring electrical characteristics of chips Hiroshi Shimoyama, Masaru Suzuki 2011-05-10
7701236 Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer Shuji Akiyama, Tadashi Obikane, Masaru Suzuki, Yasuhito Yamamoto, Yuji Asakawa +6 more 2010-04-20
7161419 Sensor device and a signal amplification device of a small detection signal provided by the sensor Koryo Tei, Hiroyuki Kawanishi 2007-01-09
4527699 Vessel for storing liquid Kazuya Namba, Hirosi Nakazima, Yu Muraki 1985-07-09