Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12106997 | Test device, change kit, and method of exchanging change kit | Hiroki Hosaka, Hiroshi Amemiya, Fumito Kagami | 2024-10-01 |
| 8905700 | Transfer and inspection devices of object to be inspected | — | 2014-12-09 |
| 8726748 | Probe apparatus and substrate transfer method | Kazuya Yano, Hiroshi Yamada, Masaru Suzuki, Yasuhito Yamamoto | 2014-05-20 |
| 8310261 | Probing apparatus and probing method | Hiroki Hosaka, Shuji Akiyama | 2012-11-13 |
| 8267633 | FOUP opening/closing device and probe apparatus | — | 2012-09-18 |
| 7887280 | Processing apparatus | Hiroki Hosaka, Shuji Akiyama | 2011-02-15 |
| 7741837 | Probe apparatus | Shuji Akiyama | 2010-06-22 |
| 7701236 | Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer | Shuji Akiyama, Masaru Suzuki, Yasuhito Yamamoto, Kazuya Yano, Yuji Asakawa +6 more | 2010-04-20 |
| D607424 | Wafer carrying-in/out apparatus | Hiroki Hosaka, Shuji Akiyama | 2010-01-05 |
| D602882 | Wafer carrying-in/out apparatus | Hiroki Hosaka, Shuji Akiyama | 2009-10-27 |
| 7583096 | Probing apparatus and probing method | Hiroki Hosaka, Shuji Akiyama | 2009-09-01 |
| D592230 | Wafer carrying-in/out machine | Hiroki Hosaka, Shuji Akiyama | 2009-05-12 |
| 6830651 | Load port capable of coping with different types of cassette containing substrates to be processed | — | 2004-12-14 |
| 6441630 | Probing apparatus and head plate opening/closing force-reducing mechanism | Masashi Shimizu | 2002-08-27 |
| 5828225 | Semiconductor wafer probing apparatus | Eiji Hayashi, Ryoichiro Koshi | 1998-10-27 |
| 5086270 | Probe apparatus | Wataru Karasawa, Taketoshi Itoyama, Itaru Takao, Hisashi Koike | 1992-02-04 |
| 4950982 | Electric probing test machine | Hisashi Koike, Sumi Tanaka | 1990-08-21 |