Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12106997 | Test device, change kit, and method of exchanging change kit | Hiroki Hosaka, Fumito Kagami, Tadashi Obikane | 2024-10-01 |
| 7385386 | Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober | Koji Kawaguchi, Masaru Suzuki | 2008-06-10 |
| 6958618 | Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober | Koji Kawaguchi, Masaru Suzuki | 2005-10-25 |
| 6762616 | Probe system | Koji Kawaguchi, Hiroshi Kaneko, Tatsuo Kawashima | 2004-07-13 |
| 6249132 | Inspection methods and apparatuses | — | 2001-06-19 |
| 6169409 | Low-temperature wafer testing method and prober | — | 2001-01-02 |
| 5031125 | Apparatus for measuring electron temperature | Kazuo Shimizu, Yuichi Sakamoto | 1991-07-09 |
| 4922205 | Apparatus for detecting contamination on probe surface | Kazuo Shimizu, Yuichi Sakamoto | 1990-05-01 |