Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11467099 | Inspection apparatus | Kazumi Yamagata | 2022-10-11 |
| 11385260 | Probe card holding device and inspection device | Kazumi Yamagata | 2022-07-12 |
| 10962565 | Substrate inspection apparatus | Michio Murata | 2021-03-30 |
| 6762616 | Probe system | Koji Kawaguchi, Hiroshi Amemiya, Hiroshi Kaneko | 2004-07-13 |