Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11467099 | Inspection apparatus | Tatsuo Kawashima | 2022-10-11 |
| 11385260 | Probe card holding device and inspection device | Tatsuo Kawashima | 2022-07-12 |
| 11221350 | Probe device for improving transfer accuracy of needle traces of probes and needle trace transcription method therefor | Tomohiro Ota, Mitsushiro Mochizuki | 2022-01-11 |
| 7944200 | Probe apparatus | Tomoya Endo, Hiroshi Yamada | 2011-05-17 |
| 7701236 | Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer | Shuji Akiyama, Tadashi Obikane, Masaru Suzuki, Yasuhito Yamamoto, Kazuya Yano +6 more | 2010-04-20 |
| 6118290 | Prober and method for cleaning probes provided therein | Masahiko Sugiyama, Yoshihiko Nakamura | 2000-09-12 |
| 6060892 | Probe card attaching mechanism | — | 2000-05-09 |
| D383683 | Wafer prober | Osamu Kamata, Masahiko Sugiyama, Munetoshi Nagasaka, Haruhiko Yoshioka | 1997-09-16 |
| 5640100 | Probe apparatus having probe card exchanging mechanism | Minoru Uchida | 1997-06-17 |