HY

Haruhiko Yoshioka

TL Tokyo Electron Limited: 15 patents #423 of 5,567Top 8%
TL Tokyo Electron Yamanashi Limited: 4 patents #7 of 138Top 6%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 Yamanashi, JP: #253 of 1,957 inventorsTop 15%
Overall (All Time): #326,749 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
7221176 Vacuum prober and vacuum probe method Kiyoshi Takekoshi, Shinjiro Watanabe 2007-05-22
7106082 Stage driving apparatus and probe method 2006-09-12
6933736 Prober Masahito Kobayashi, Takafumi Fujita 2005-08-23
6927587 Probe apparatus 2005-08-09
6850052 Probing method Shinji Iino 2005-02-01
6634245 Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism Shinji Iino, Yutaka Akaike, Masaru Suzuki 2003-10-21
6262570 Probe apparatus Yutaka Akaike, Chiaki Mochizuki, Isao Kono 2001-07-17
6140828 Prober and probe method Shinji Iino 2000-10-31
5912555 Probe apparatus Yutaka Akaike, Chiaki Mochizuki, Isao Kono 1999-06-15
5804983 Probe apparatus with tilt correction mechanisms Hisashi Nakajima 1998-09-08
D383683 Wafer prober Osamu Kamata, Masahiko Sugiyama, Munetoshi Nagasaka, Kazumi Yamagata 1997-09-16
5642056 Probe apparatus for correcting the probe card posture before testing Hisashi Nakajima 1997-06-24
5640101 Probe system and probe method Motohiro Kuji, Shinji Akaike, Shigeaki Takahashi 1997-06-17
5585738 Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment Motohiro Kuji, Shinji Akaike, Shigeaki Takahashi 1996-12-17
4812201 Method of ashing layers, and apparatus for ashing layers Hiroyuki Sakai, Kazutoshi Yoshioka, Kimiharu Matsumura, Keisuke Shigaki, Yutaka Amemiya +2 more 1989-03-14