Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6433566 | Probing method and probing system | Isamu Inomata | 2002-08-13 |
| 6317647 | Aligner | Yutaka Akaike, Satoshi Sano | 2001-11-13 |
| 6307390 | Aligner and method for inspecting semiconductor wafer using shell | Yutaka Akaike, Satoshi Sano | 2001-10-23 |
| 6262570 | Probe apparatus | Yutaka Akaike, Chiaki Mochizuki, Haruhiko Yoshioka | 2001-07-17 |
| 5912555 | Probe apparatus | Yutaka Akaike, Chiaki Mochizuki, Haruhiko Yoshioka | 1999-06-15 |