Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5910727 | Electrical inspecting apparatus with ventilation system | Kaoru Fujihara | 1999-06-08 |
| 5640101 | Probe system and probe method | Haruhiko Yoshioka, Shinji Akaike, Shigeaki Takahashi | 1997-06-17 |
| 5585738 | Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment | Haruhiko Yoshioka, Shinji Akaike, Shigeaki Takahashi | 1996-12-17 |