Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759762 | Probe device | Eiichi Shinohara, Ken Taoka, Yoshiyasu Kato | 2017-09-12 |
| 9638719 | Probe device having cleaning mechanism for cleaning connection conductor | Eiichi Shinohara, Yoshiyasu Kato | 2017-05-02 |
| 9523711 | Probe apparatus and wafer mounting table for probe apparatus | Kazuya Yano, Eiji Hayashi | 2016-12-20 |
| 9261553 | Probe apparatus | Eiichi Shinohara, Isamu Inomata, Kazuya Yano, Yoshiyasu Kato | 2016-02-16 |
| 8196983 | Substrate attracting device and substrate transfer apparatus | Ikuo Ogasawara | 2012-06-12 |
| 8082977 | Ceramic mounting for wafer apparatus with thermal expansion feature | Yutaka Akaike | 2011-12-27 |
| D612879 | Semiconductor wafer inspection apparatus | — | 2010-03-30 |
| D609652 | Wafer attracting plate | Ikuo Ogasawara, Eiichi Shinohara | 2010-02-09 |
| 7541801 | Probe card transfer assist apparatus, and inspection equipment and method using same | Chiaki Mochizuki | 2009-06-02 |
| 7528620 | Probe card transfer assist apparatus and inspection equipment using same | Chiaki Mochizuki | 2009-05-05 |
| D589912 | Wafer holding member | Ikuo Ogasawara | 2009-04-07 |
| D589474 | Wafer holding member | Ikuo Ogasawara | 2009-03-31 |
| D383683 | Wafer prober | Osamu Kamata, Masahiko Sugiyama, Haruhiko Yoshioka, Kazumi Yamagata | 1997-09-16 |
| 5604443 | Probe test apparatus | Yoshisuke Kitamura | 1997-02-18 |