Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759762 | Probe device | Munetoshi Nagasaka, Ken Taoka, Yoshiyasu Kato | 2017-09-12 |
| 9658285 | Probe apparatus | Isao Kouno, Ken Taoka, Ikuo Ogasawara | 2017-05-23 |
| 9638719 | Probe device having cleaning mechanism for cleaning connection conductor | Munetoshi Nagasaka, Yoshiyasu Kato | 2017-05-02 |
| 9562942 | Probe apparatus | Kenji Yamaguchi, Masataka Hatta | 2017-02-07 |
| 9347970 | Probe apparatus | Ken Taoka | 2016-05-24 |
| 9322844 | Probe card for power device | Ikuo Ogasawara, Ken Taoka | 2016-04-26 |
| 9261553 | Probe apparatus | Munetoshi Nagasaka, Isamu Inomata, Kazuya Yano, Yoshiyasu Kato | 2016-02-16 |
| 8085052 | Charge eliminating apparatus and method, and program storage medium for removing static electricity from a target object such as a wafer | Kazuki Hanawa | 2011-12-27 |
| 7859279 | Charge eliminating apparatus and method, and program storage medium | Kazuki Hanawa | 2010-12-28 |
| D609652 | Wafer attracting plate | Munetoshi Nagasaka, Ikuo Ogasawara | 2010-02-09 |