Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293873 | Input device | Tatsuhiro Tomiyama, Kazunari Takahashi, Yuki IKEZOE, Takenori TAKAHASHI, Misuzu SUTO +1 more | 2025-05-06 |
| 12105895 | Operating device using variable resistor | Kazuhiko Sasaki | 2024-10-01 |
| 11454664 | Testing system | Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata +8 more | 2022-09-27 |
| 11454667 | Inspection apparatus and method of adjusting position of chuck top | — | 2022-09-27 |
| 11391758 | Testing apparatus and method of controlling testing apparatus | — | 2022-07-19 |
| 11385286 | Method for controlling test apparatus and test apparatus | — | 2022-07-12 |
| 11364435 | Operation device | Makoto Hayashi, Tatsuaki Kawase, Nobuyuki Ninomiya, Tomoyasu Nagano, Hidekazu Kato +1 more | 2022-06-21 |
| 11360115 | Inspection system | Takanori Hyakudomi, Jun Fujihara, Hiroaki Sakamoto, Xingjun Jiang | 2022-06-14 |
| 11226368 | Placement apparatus control method, placement apparatus, and inspection apparatus | — | 2022-01-18 |
| 11181573 | Inspection apparatus and cleaning method of inspection apparatus | Kentaro Konishi | 2021-11-23 |
| 11133214 | Substrate transportation method | — | 2021-09-28 |
| 11131708 | Aligning mechanism and aligning method | — | 2021-09-28 |
| 10809294 | Stage device and probe device | — | 2020-10-20 |
| 10205279 | Interface apparatus, interface unit, probe apparatus, and connection method | — | 2019-02-12 |
| 8130004 | Probe apparatus and method for correcting contact position by adjusting overdriving amount | Hiroshi Yamada, Shinya Koizumi | 2012-03-06 |
| 7994809 | Transfer mechanism for target object to be inspected | Yutaka Akaike, Hiroshi Yamada | 2011-08-09 |
| 7944200 | Probe apparatus | Hiroshi Yamada, Kazumi Yamagata | 2011-05-17 |