Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11454664 | Testing system | Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata +8 more | 2022-09-27 |
| 11360115 | Inspection system | Jun Fujihara, Hiroaki Sakamoto, Tomoya Endo, Xingjun Jiang | 2022-06-14 |
| 11099236 | Inspection device and contact method | Masanori Ueda, Jun Fujihara, Kentaro Konishi | 2021-08-24 |
| 9863977 | Method of contacting substrate with probe card | Kunihiro Furuya, Hiroshi Yamada, Jun Mochizuki | 2018-01-09 |
| 7679387 | Inspection method, inspection apparatus, and control program for performing electrical inspection by using probe | — | 2010-03-16 |
| 7477064 | Probing apparatus and positional deviation acquiring method | Daiki Kurihara, Hiromi Chaya | 2009-01-13 |
| 7397257 | Detection method/device of probe's tip location using a transparent film attached to a substate having plurality of electrodes, and a storage medium for implementing the method | Masahito Kobayashi | 2008-07-08 |
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method | Shigekazu Komatsu, Hiromi Chaya, Takahisa Hayashi, Yukihide Shigeno | 2007-05-22 |
| 6739208 | Method of delivering target object to be processed, table mechanism of target object and probe apparatus | — | 2004-05-25 |