Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7477064 | Probing apparatus and positional deviation acquiring method | Daiki Kurihara, Takanori Hyakudomi | 2009-01-13 |
| 7224175 | Probe mark reading device and probe mark reading method | Takahisa Hayashi, Shigekazu Komatsu | 2007-05-29 |
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method | Shigekazu Komatsu, Takanori Hyakudomi, Takahisa Hayashi, Yukihide Shigeno | 2007-05-22 |
| 7026832 | Probe mark reading device and probe mark reading method | Takahisa Hayashi, Shigekazu Komatsu | 2006-04-11 |
| 4639879 | Method and device for light emitting intensity control in a graphic display device | — | 1987-01-27 |