Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method | Shigekazu Komatsu, Takanori Hyakudomi, Hiromi Chaya, Takahisa Hayashi | 2007-05-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method | Shigekazu Komatsu, Takanori Hyakudomi, Hiromi Chaya, Takahisa Hayashi | 2007-05-22 |