Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12117485 | Wafer inspection system | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2024-10-15 |
| 11762012 | Wafer inspection system | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2023-09-19 |
| 11567123 | Wafer inspection system | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2023-01-31 |
| 11061071 | Wafer inspection system, wafer inspection apparatus and prober | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2021-07-13 |
| 10976364 | Test head and wafer inspection apparatus | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2021-04-13 |
| 10753972 | Wafer inspection system, wafer inspection apparatus and prober | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2020-08-25 |
| 9671459 | Maintenance carriage for wafer inspection apparatus and maintenance method for wafer inspection apparatus | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2017-06-06 |
| 8766658 | Probe | — | 2014-07-01 |
| 8723544 | Structure of probe card for inspecting electrical characteristics of object to be inspected | Syuichi Tsukada | 2014-05-13 |
| 8468690 | Holding member for use in test and method for manufacturing same | Yasunori Kumagai | 2013-06-25 |
| 8471585 | Method for evaluating semiconductor device | Mitsuyoshi Miyazono, Dai Shinozaki, Masahiro Kato, Atsushi Yoshida | 2013-06-25 |
| 8159245 | Holding member for inspection, inspection device and inspecting method | Mitsuyoshi Miyazono, Kazuya Asaoka | 2012-04-17 |
| 7750654 | Probe method, prober, and electrode reducing/plasma-etching processing mechanism | Katsuya Okumura, Yuichi Abe, Kunihiro Furuya, Vincent Vezin, Kenichi Kubo | 2010-07-06 |
| 7701241 | Circuit for protecting DUT, method for protecting DUT, testing apparatus and testing method | Yasunori Kumagai, Dai Shinozaki, Katsuaki Sakamoto | 2010-04-20 |
| 7692435 | Probe card and probe device for inspection of a semiconductor device | Takashi Amemiya, Jun Mochizuki | 2010-04-06 |
| 7688088 | Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object | Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2010-03-30 |
| 7586317 | Inspection apparatus, probe card and inspection method | Dai Shinozaki, Katsuaki Sakamoto | 2009-09-08 |
| 7301357 | Inspection method and inspection equipment | Dai Shinozaki | 2007-11-27 |
| 7262618 | Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object | — | 2007-08-28 |
| 7262613 | Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object | Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2007-08-28 |
| 7224175 | Probe mark reading device and probe mark reading method | Hiromi Chaya, Takahisa Hayashi | 2007-05-29 |
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method | Takanori Hyakudomi, Hiromi Chaya, Takahisa Hayashi, Yukihide Shigeno | 2007-05-22 |
| 7135883 | Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object | — | 2006-11-14 |
| 7026832 | Probe mark reading device and probe mark reading method | Hiromi Chaya, Takahisa Hayashi | 2006-04-11 |