Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8723544 | Structure of probe card for inspecting electrical characteristics of object to be inspected | Shigekazu Komatsu | 2014-05-13 |
| 8063652 | Probing apparatus and method for adjusting probing apparatus | Takashi Amemiya | 2011-11-22 |
| 7847569 | Probe device and method of regulating contact pressure between object to be inspected and probe | Toshihiro Yonezawa | 2010-12-07 |
| 7679385 | Probe card for inspecting electric properties of an object | Takashi Amemiya | 2010-03-16 |