Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8674717 | Cantilevered probe having a bending contact | — | 2014-03-18 |
| 8415964 | Probe card having a structure for being prevented from deforming | Shinichiro Takase | 2013-04-09 |
| 8319511 | Probe device having a structure for being prevented from deforming | Shinichiro Takase | 2012-11-27 |
| RE42655 | Mechanism for fixing probe card | — | 2011-08-30 |
| RE42115 | Mechanism for fixing probe card | — | 2011-02-08 |
| 7847569 | Probe device and method of regulating contact pressure between object to be inspected and probe | Syuichi Tsukada | 2010-12-07 |
| 7649369 | Probe and method of manufacturing probe | Katsuya Okumura | 2010-01-19 |
| 6831455 | Mechanism for fixing probe card | — | 2004-12-14 |
| 6205652 | Vacuum coupling system | Hiroshi Tsukada | 2001-03-27 |
| 6084215 | Semiconductor wafer holder with spring-mounted temperature measurement apparatus disposed therein | Kunihiro Furuya, Ken Inoue, Yoichi NAKAGOMI | 2000-07-04 |
| 5999268 | Apparatus for aligning a semiconductor wafer with an inspection contactor | Kunio Sano, Takashi Sato | 1999-12-07 |
| 5708222 | Inspection apparatus, transportation apparatus, and temperature control apparatus | Tsuyoshi Argua, Kunihiro Furuya, Junichi Hagihara | 1998-01-13 |