Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8415964 | Probe card having a structure for being prevented from deforming | Toshihiro Yonezawa | 2013-04-09 |
| 8319511 | Probe device having a structure for being prevented from deforming | Toshihiro Yonezawa | 2012-11-27 |
| 8310257 | Contact structure for inspection | Kunihiro Furuya, Jun Mochizuki | 2012-11-13 |