TI

Toshihiro Itoh

UN Unknown: 11 patents #718 of 83,584Top 1%
TL Tokyo Electron Limited: 6 patents #1,241 of 5,567Top 25%
SO Sony: 3 patents #10,744 of 25,231Top 45%
KT Kabushiki Kaisha Toshiba: 3 patents #8,011 of 21,451Top 40%
NE Nec: 3 patents #4,195 of 14,502Top 30%
NT NTT: 3 patents #1,627 of 4,871Top 35%
RT Renesas Technology: 3 patents #990 of 3,337Top 30%
Rohm Co.: 3 patents #810 of 2,292Top 40%
SC Sanyo Electric Co.: 3 patents #1,910 of 6,347Top 35%
Sharp Kabushiki Kaisha: 3 patents #4,164 of 10,731Top 40%
Fujitsu Limited: 3 patents #8,614 of 24,456Top 40%
OC Oki Electric Industry Co.: 2 patents #947 of 2,807Top 35%
Sumitomo Electric Industries: 2 patents #9,741 of 21,551Top 50%
SC Shinko Electric Industries Co.: 1 patents #437 of 723Top 65%
TS Tadatomo Suga: 1 patents #3 of 12Top 25%
OC Oki Semiconductor Co.: 1 patents #202 of 526Top 40%
Mitsubishi Electric: 1 patents #15,491 of 25,717Top 65%
Yamaha: 1 patents #1,232 of 2,001Top 65%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
PA Panasonic: 1 patents #13,264 of 21,108Top 65%
Overall (All Time): #319,193 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10601522 Optical receiver Yuriko Kawamura, Kiyofumi Kikuchi, Ken Tsuzuki, Hiroshi Fukuda, Shin Kamei 2020-03-24
10243664 Optical modulator driver circuit and optical transmitter Munehiko Nagatani, Hideyuki Nosaka, Koichi Murata, Hiroyuki Fukuyama, Takashi Saida +15 more 2019-03-26
9516699 Sensor network system Hironao Okada, Masao Arakawa, Toshio Sakamizu 2016-12-06
7776735 Semiconductor device and process for manufacturing the same Tadatomo Suga 2010-08-17
7688088 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Shigekazu Komatsu, Tadatomo Suga, Kenichi Kataoka 2010-03-30
7319339 Inspection apparatus to break the oxide of an electrode by fritting phenomenon Shinji Iino, Kiyoshi Takekoshi, Tadatomo Suga, Kenichi Kataoka 2008-01-15
7304489 Inspection method and inspection apparatus Shinji Iino, Kiyoshi Takekoshi, Tadatomo Suga, Kenichi Kataoka 2007-12-04
7301243 High-reliable semiconductor device using hermetic sealing of electrodes Tadatomo Suga 2007-11-27
7268430 Semiconductor device and process for manufacturing the same Tadatomo Suga 2007-09-11
7262613 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Shigekazu Komatsu, Tadatomo Suga, Kenichi Kataoka 2007-08-28
7100279 Method of mounting an electronic part Tadatomo Suga, Hideto Nakazawa, Masatoshi Akagawa 2006-09-05
7061259 Inspection method and inspection apparatus Shinji Iino, Kiyoshi Takekoshi, Tadatomo Suga, Kenichi Kataoka 2006-06-13
6936758 Player information-providing method, server, program for controlling the server, and storage medium storing the program 2005-08-30
6777967 Inspection method and inspection apparatus Shinji Iino, Kiyoshi Takekoshi, Tadatomo Suga, Kenichi Kataoka 2004-08-17
6188346 Analog-to-digital conversion device Takao Waho 2001-02-13