Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12117485 | Wafer inspection system | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2024-10-15 |
| 11762012 | Wafer inspection system | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2023-09-19 |
| 11567123 | Wafer inspection system | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2023-01-31 |
| 11061071 | Wafer inspection system, wafer inspection apparatus and prober | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2021-07-13 |
| 10976364 | Test head and wafer inspection apparatus | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2021-04-13 |
| 10753972 | Wafer inspection system, wafer inspection apparatus and prober | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2020-08-25 |
| 9671459 | Maintenance carriage for wafer inspection apparatus and maintenance method for wafer inspection apparatus | Junichi Hagihara, Shigekazu Komatsu, Kunihiro Furuya, Naoki Muramatsu | 2017-06-06 |