Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082524 | Prober in which probe head of probe card is replaced automatically | — | 2018-09-25 |
| 9194906 | Probe apparatus | — | 2015-11-24 |
| 8471585 | Method for evaluating semiconductor device | Shigekazu Komatsu, Dai Shinozaki, Masahiro Kato, Atsushi Yoshida | 2013-06-25 |
| 8159245 | Holding member for inspection, inspection device and inspecting method | Shigekazu Komatsu, Kazuya Asaoka | 2012-04-17 |