Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12117483 | Inspection system and inspection method | — | 2024-10-15 |
| 12061226 | Support device, test system, and method of controlling support device | — | 2024-08-13 |
| 11933839 | Inspection apparatus and inspection method | — | 2024-03-19 |
| 11852677 | Test system | — | 2023-12-26 |
| 11467208 | Contact release method in inspection apparatus and inspection apparatus | Jun Fujihara | 2022-10-11 |
| 11454664 | Testing system | Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata, Katsuaki Sugiyama +8 more | 2022-09-27 |
| 11442096 | Testing apparatus | Jun Fujihara | 2022-09-13 |
| 11181573 | Inspection apparatus and cleaning method of inspection apparatus | Tomoya Endo | 2021-11-23 |
| 11169206 | Inspection apparatus, inspection system, and aligning method | Jun Fujihara, Masanori Ueda | 2021-11-09 |
| 11099236 | Inspection device and contact method | Takanori Hyakudomi, Masanori Ueda, Jun Fujihara | 2021-08-24 |
| 11067624 | Inspection system | Hiroki Shikagawa, Jun Fujihara | 2021-07-20 |
| 7148895 | Time-series data processing device and method | Masaki Usui, Tatsuya Okahara | 2006-12-12 |