Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11454664 | Testing system | Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata +8 more | 2022-09-27 |
| 11293978 | Voltage application device for testing plurality of devices and method of forming output voltage waveform | Shigeki Ishii, Kenichi Narikawa, Koji Shinagawa, Takumi Nagura | 2022-04-05 |