Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11454664 | Testing system | Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata +8 more | 2022-09-27 |
| 11293978 | Voltage application device for testing plurality of devices and method of forming output voltage waveform | Shigeki Ishii, Katsuaki Sugiyama, Koji Shinagawa, Takumi Nagura | 2022-04-05 |
| 10859601 | Device inspection circuit, device inspection device, and probe card | — | 2020-12-08 |
| 10114070 | Substrate inspection apparatus | Michio Murata, Shingo Morita | 2018-10-30 |
| 7733113 | Semiconductor test device | — | 2010-06-08 |