Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387966 | Wafer chuck, temperature control system, and temperature control method | — | 2025-08-12 |
| 12293873 | Input device | Tatsuhiro Tomiyama, Kazunari Takahashi, Yuki IKEZOE, Misuzu SUTO, Tomoya Endo +1 more | 2025-05-06 |
| 12294273 | Vibration generating device | Yuki IKEZOE, Kazunari Takahashi | 2025-05-06 |
| 9869715 | Semiconductor wafer inspection apparatus and semiconductor wafer inspection method | Takashi Ishimoto, Yuji Shigesawa, Akira Yamaguchi, Takashi Motoyama | 2018-01-16 |