Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869715 | Semiconductor wafer inspection apparatus and semiconductor wafer inspection method | Yuji Shigesawa, Akira Yamaguchi, Takashi Motoyama, Takenori TAKAHASHI | 2018-01-16 |
| 7129507 | Chip mis-position detection method | Akira Yamamoto, Konosuke Murakami, Yoshio Niki, Yutaka Ueda | 2006-10-31 |
| 6366102 | Wafer probing machine | — | 2002-04-02 |
| 5568056 | Wafer prober | — | 1996-10-22 |
| 5002009 | Furnace for formation of black oxide film on the surface of thin metal sheet and method for formation of black oxide film on the surface of shadow mask material by use of said furnace | Toshitomo Hayami, Humio Shibata, Katsumi Iguchi, Hisao Inoue, Takashi Ono | 1991-03-26 |
| 4859251 | Furnace for formation of black oxide film on the surface of thin metal sheet and method for formation of black oxide film on the surface of shadow mask material by use of said furnace | Toshitomo Hayami, Humio Shibata, Katsumi Iguchi, Hisao Inoue, Takashi Ono | 1989-08-22 |