Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869715 | Semiconductor wafer inspection apparatus and semiconductor wafer inspection method | Takashi Ishimoto, Yuji Shigesawa, Akira Yamaguchi, Takenori TAKAHASHI | 2018-01-16 |
| 8693285 | Sound generation system, ultrasonic wave emitting device, and ultrasonic wave emitting method | Ayase Watanabe, Koji Arata, Tatsuyuki NEGISHI, Takafumi Tokuhiro | 2014-04-08 |
| 8547279 | Incoming wave classifying and distinguishing device, incoming wave classifying and distinguishing method, originating position estimating device and originating position estimating method | Takafumi Tokuhiro, Yutaka Saito | 2013-10-01 |