Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869715 | Semiconductor wafer inspection apparatus and semiconductor wafer inspection method | Takashi Ishimoto, Akira Yamaguchi, Takashi Motoyama, Takenori TAKAHASHI | 2018-01-16 |
| 9519009 | Prober | Konosuke Murakami, Toshiro Mori, Kazuhisa Aoki, Akira Yamaguchi | 2016-12-13 |