Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7454317 | Apparatus productivity improving system and its method | — | 2008-11-18 |
| 7133807 | Apparatus productivity improving system and its method | — | 2006-11-07 |
| 6969620 | Semiconductor device inspection system | — | 2005-11-29 |
| 6839603 | Semiconductor manufacturing system and control method thereof | — | 2005-01-04 |
| 5436571 | Probing test method of contacting a plurality of probes of a probe card with pads on a chip on a semiconductor wafer | — | 1995-07-25 |
| 5404111 | Probe apparatus with a swinging holder for an object of examination | Shigeoki Mori, Hitoshi Fujihara, Masaru Suzuki, Keiichi Yokota | 1995-04-04 |
| 5374888 | Electrical characteristics measurement method and measurement apparatus therefor | — | 1994-12-20 |
| 5321453 | Probe apparatus for probing an object held above the probe card | Shigeoki Mori | 1994-06-14 |
| 5124931 | Method of inspecting electric characteristics of wafers and apparatus therefor | Masaaki Iwamatsu, Ryuichi Takebuchi, Yoshihito Marumo | 1992-06-23 |
| 5086270 | Probe apparatus | Taketoshi Itoyama, Itaru Takao, Tadashi Obikane, Hisashi Koike | 1992-02-04 |
| D320361 | Wafer probe plate holder | — | 1991-10-01 |
| 4985676 | Method and apparatus of performing probing test for electrically and sequentially testing semiconductor device patterns | — | 1991-01-15 |
| 4965515 | Apparatus and method of testing a semiconductor wafer | — | 1990-10-23 |
| 4812901 | Probe apparatus | — | 1989-03-14 |