Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5665610 | Semiconductor device checking method | Yoshiro Nakata, Shinichi Oki, Koichi Nagao, Kenzo Hatada, Takashi Sato +1 more | 1997-09-09 |
| 5642432 | Probe device | — | 1997-06-24 |
| 5416592 | Probe apparatus for measuring electrical characteristics of objects | Keiichi Yokota | 1995-05-16 |
| 5404111 | Probe apparatus with a swinging holder for an object of examination | Wataru Karasawa, Hitoshi Fujihara, Masaru Suzuki, Keiichi Yokota | 1995-04-04 |
| 5321453 | Probe apparatus for probing an object held above the probe card | Wataru Karasawa | 1994-06-14 |