Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5124931 | Method of inspecting electric characteristics of wafers and apparatus therefor | Ryuichi Takebuchi, Yoshihito Marumo, Wataru Karasawa | 1992-06-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5124931 | Method of inspecting electric characteristics of wafers and apparatus therefor | Ryuichi Takebuchi, Yoshihito Marumo, Wataru Karasawa | 1992-06-23 |