Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5321352 | Probe apparatus and method of alignment for the same | — | 1994-06-14 |
| 5124931 | Method of inspecting electric characteristics of wafers and apparatus therefor | Masaaki Iwamatsu, Yoshihito Marumo, Wataru Karasawa | 1992-06-23 |
| 4966520 | Method of positioning objects to be measured | Keiichi Yokota | 1990-10-30 |