Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7991219 | Method and apparatus for detecting positions of electrode pads | — | 2011-08-02 |
| 5936416 | Probe inspection apparatus | Hideaki Tanaka | 1999-08-10 |
| 5777485 | Probe method and apparatus with improved probe contact | Hideaki Tanaka, Shinji Akaike | 1998-07-07 |
| 5124931 | Method of inspecting electric characteristics of wafers and apparatus therefor | Masaaki Iwamatsu, Ryuichi Takebuchi, Wataru Karasawa | 1992-06-23 |