Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5410259 | Probing device setting a probe card parallel | Hitoshi Fujihara | 1995-04-25 |
| D350490 | Semiconductor wafer testing apparatus | — | 1994-09-13 |
| D323628 | Semiconductor wafer measuring instrument | — | 1992-02-04 |
| 5086270 | Probe apparatus | Wataru Karasawa, Taketoshi Itoyama, Tadashi Obikane, Hisashi Koike | 1992-02-04 |
| 5065495 | Method for holding a plate-like member | Masaki Narushima | 1991-11-19 |
| 4955590 | Plate-like member receiving apparatus | Masaki Narushima | 1990-09-11 |
| 4941800 | Transfer apparatus for plate-like member | Hisashi Koike, Masaki Narushima, Kiyoshi Takekoshi | 1990-07-17 |