Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8546185 | Method for manufacturing semiconductor device | Ken Nakao, Muneo Harada, Eiji Yamaguchi | 2013-10-01 |
| 6380753 | Screening method of semiconductor device and apparatus thereof | Shinji Iino | 2002-04-30 |
| 6268740 | System for testing semiconductor device formed on semiconductor wafer | — | 2001-07-31 |
| 5691764 | Apparatus for examining target objects such as LCD panels | Kiyoshi Takekoshi, Shinji Iino | 1997-11-25 |
| 5568054 | Probe apparatus having burn-in test function | Shinji Iino | 1996-10-22 |