Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7340360 | Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness | John H. Zhang, Kurt Taylor, Eugene Zhao, Amit P. Marathe, Rolf Geilenkeuser | 2008-03-04 |