Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6570228 | Method and apparatus for electrically measuring insulating film thickness | Mark B. Fuselier, Michael Fenske | 2003-05-27 |
| 6410350 | Detecting die speed variations | Mark B. Fuselier, Stephen Doug Ray, Michael J. Dunn, Michael Fenske | 2002-06-25 |
| 6287877 | Electrically quantifying transistor spacer width | Mark B. Fuselier, Michael Fenske | 2001-09-11 |