YM

Yuansheng Ma

Globalfoundries: 8 patents #444 of 4,424Top 15%
MG Mentor Graphics: 3 patents #124 of 698Top 20%
AM AMD: 2 patents #3,994 of 9,279Top 45%
SS Siemens Industry Software: 1 patents #111 of 391Top 30%
📍 Fremont, CA: #1,248 of 9,298 inventorsTop 15%
🗺 California: #43,449 of 386,348 inventorsTop 15%
Overall (All Time): #336,215 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12411405 Optical proximity correction based on combining inverse lithography technology with pattern classification Le Hong, Rui Wu, Junjiang Lei 2025-09-09
10311165 Guiding patterns optimization for directed self-assembly Junjiang Lei, Le Hong 2019-06-04
9836556 Optical proximity correction for directed-self-assembly guiding patterns Junjiang Lei, Le Hong 2017-12-05
9330228 Generating guiding patterns for directed self-assembly Juan Andres Torres Robles, Joydeep Mitra, Krasnova Polina Andreevna, Yuri Granik 2016-05-03
9159724 Cross-coupling-based design using diffusion contact structures Yan Wang, Jongwook Kye, Mahbub Rashed 2015-10-13
9142513 Middle-of-the-line constructs using diffusion contact structures Mahbub Rashed, Irene Y. Lin, Jason E. Stephens, Yunfei Deng, Yuan Lei +5 more 2015-09-22
9006100 Middle-of-the-line constructs using diffusion contact structures Mahbub Rashed, Irene Y. Lin, Jason E. Stephens, Yunfei Deng, Yuan Lei +5 more 2015-04-14
8741763 Layout designs with via routing structures Jongwook Kye, Harry J. Levinson, Hidekazu Yoshida, Mahbub Rashed 2014-06-03
8679911 Cross-coupling-based design using diffusion contact structures Yan Wang, Jongwook Kye, Mahbub Rashed 2014-03-25
8598633 Semiconductor device having contact layer providing electrical connections Marc Tarabbia, James B. Gullette, Mahbub Rashed, David Doman, Irene Y. Lin +12 more 2013-12-03
8581348 Semiconductor device with transistor local interconnects Mahbub Rashed, Steven R. Soss, Jongwook Kye, Irene Y. Lin, James B. Gullette +9 more 2013-11-12
8367430 Shape characterization with elliptic fourier descriptor for contact or any closed structures on the chip Harry J. Levinson, Jongwook Kye 2013-02-05
8067252 Method for determining low-noise power spectral density for characterizing line edge roughness in semiconductor wafer processing Harry J. Levinson, Thomas I. Wallow 2011-11-29
7861195 Process for design of semiconductor circuits Darin A. Chan, Yi Zou, Marilyn I. Wright, Mark W. Michael 2010-12-28