AM

Alan J. Miller

Lam Research: 20 patents #121 of 2,128Top 6%
BC Bromine Compounds: 1 patents #83 of 181Top 50%
SC Schering: 1 patents #1,469 of 2,442Top 65%
TT Tenova Advanced Technologies: 1 patents #4 of 11Top 40%
📍 Moraga, CA: #24 of 363 inventorsTop 7%
🗺 California: #25,620 of 386,348 inventorsTop 7%
Overall (All Time): #194,725 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
11112773 Systems for removing and replacing consumable parts from a semiconductor process module in situ David Trussell, John Daugherty, Alex Paterson 2021-09-07
11041227 Process for recovering gold from ores Keren Larmour-Ship, Tal Fabian, Sharon Krumbein Rubin, Elizabeta Shandalov, Mira Bergstein Freiberg 2021-06-22
9941178 Methods for detecting endpoint for through-silicon via reveal applications Evelio Sevillano, Jorge Luque, Andrew D. Bailey, III, Qing Xu 2018-04-10
9543225 Systems and methods for detecting endpoint for through-silicon via reveal applications Evelio Sevillano, Jorge Luque, Andrew D. Bailey, III, Qing Xu 2017-01-10
8871105 Method for achieving smooth side walls after Bosch etch process Jaroslaw W. Winniczek, Frank Y. Lin, Qing Xu, Seongjun Heo, Jin-Hwan Ham +2 more 2014-10-28
8609548 Method for providing high etch rate Qing Xu, Camelia Rusu, Jaroslaw W. Winniczek, Frank Y. Lin 2013-12-17
7682980 Method to improve profile control and N/P loading in dual doped gate applications Helene Del Puppo, Frank Y. Lin, Chris Lee, Vahid Vahedi, Thomas A. Kamp +2 more 2010-03-23
7667281 Method for hard mask CD trim C. Robert Koemtzopoulos, Shibu Gangadharan, Chris Lee 2010-02-23
7605063 Photoresist stripping chamber and methods of etching photoresist on substrates Robert Chebi, Jaroslaw W. Winniczek, Gladys Lo 2009-10-20
7425277 Method for hard mask CD trim C. Robert Koemtzopoulos, Shibu Gangadharan, Chris Lee 2008-09-16
7316785 Methods and apparatus for the optimization of etch resistance in a plasma processing system Yoko Y. Adams, George Stojakovic 2008-01-08
7204934 Method for planarization etch with in-situ monitoring by interferometry prior to recess etch Linda Braly, Vahid Vahedi, Erik A. Edelberg 2007-04-17
7186661 Method to improve profile control and N/P loading in dual doped gate applications Helene Del Puppo, Frank Y. Lin, Chris Lee, Vahid Vahedi, Thomas A. Kamp +2 more 2007-03-06
7098141 Use of silicon containing gas for CD and profile feature enhancements of gate and shallow trench structures Thomas A. Kamp 2006-08-29
6939811 Apparatus and method for controlling etch depth Tom A. Kamp, Vijayakumar C. Venugopal 2005-09-06
6649996 In situ and ex situ hardmask process for STI with oxide collar application Fandayani Soesilo 2003-11-18
6432832 Method of improving the profile angle between narrow and wide features Yosias Melaku 2002-08-13
6344105 Techniques for improving etch rate uniformity John Daugherty, Neil Benjamin, Jeff A. Bogart, Vahid Vahedi, David Cooperberg +1 more 2002-02-05
6287974 Method of achieving top rounding and uniform etch depths while etching shallow trench isolation features 2001-09-11
6225234 In situ and ex situ hardmask process for STI with oxide collar application Fandayani Soesilo 2001-05-01
6218309 Method of achieving top rounding and uniform etch depths while etching shallow trench isolation features Vahid Vahedi 2001-04-17
6162910 Process for preparing lipophilic oligosaccharide antibiotics John K. Jenkins 2000-12-19