TO

Tokuhisa Ohiwa

KT Kabushiki Kaisha Toshiba: 32 patents #753 of 21,451Top 4%
TL Tokyo Electron Limited: 6 patents #1,241 of 5,567Top 25%
IBM: 3 patents #26,272 of 70,183Top 40%
EB Ebara: 1 patents #1,014 of 1,611Top 65%
SC Siemens Components: 1 patents #6 of 30Top 20%
📍 Yokohama, NY: #26 of 63 inventorsTop 45%
Overall (All Time): #108,538 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDate
9177781 Plasma processing method and manufacturing method of semiconductor device Shigeru Tahara, Eiichi Nishimura, Fumiko Yamashita, Hiroshi Tomita, Hisashi Okuchi +1 more 2015-11-03
9126229 Deposit removal method Shigeru Tahara, Eiichi Nishimura, Hiroshi Tomita, Hisashi Okuchi, Mitsuhiro Omura 2015-09-08
8513134 Semiconductor device producing method Mitsuhiro Omura, Yumi Ohno, Takaya Matsushita 2013-08-20
8487365 Semiconductor device and method for manufacturing same Toshiyuki Sasaki, Noriko SAKURAI, Katsunori Yahashi 2013-07-16
8211783 Method for manufacturing semiconductor device including a patterned SiOC film as a mask Noriko SAKURAI, Katsunori Yahashi 2012-07-03
7767055 Capacitive coupling plasma processing apparatus Shinji Himori, Noriaki Imai, Katsumi Horiguchi, Takaaki Nezu, Shoichiro Matsuyama +5 more 2010-08-03
7767582 Method of manufacturing semiconductor device Nobuyasu Nishiyama, Kazuhiro Tomioka 2010-08-03
7628931 Processing method for conservation of processing gases Masashi Saito, Yusuke Hirayama, Itsuko Sakai 2009-12-08
7595885 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device Takayuki Sakai, Masanobu Kibe 2009-09-29
7349088 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device Takayuki Sakai, Masanobu Kibe 2008-03-25
7327455 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device Takayuki Sakai, Masanobu Kibe 2008-02-05
7285498 Etching method Kazuto Ogawa, Hisataka Hayashi, Koichiro Inazawa 2007-10-23
7182879 Plasma processing method Itsuko Sakai 2007-02-27
7045462 Method for fabricating a pattern and method for manufacturing a semiconductor device Takayuki Sakai, Masanobu Kibe 2006-05-16
7022616 High speed silicon etching method Takanori Mimura, Kazuya Nagaseki, Itsuko Sakai 2006-04-04
6911398 Method of sequentially processing a plurality of lots each including semiconductor substrates Masaki Narita, Katsuya Okumura 2005-06-28
6887802 Method of manufacturing semiconductor device and semiconductor device Masaki Narita, Koichi Sato 2005-05-03
6846750 High precision pattern forming method of manufacturing a semiconductor device Shoji Seta, Nobuo Hayasaka, Katsuya Okumura, Akihiro Kojima, Junko Ohuchi +3 more 2005-01-25
6782907 Gas recirculation flow control method and apparatus for use in vacuum system Hiroyuki Kawasaki, Itsuko Sakai 2004-08-31
6780278 Plasma processing apparatus with reduced parasitic capacity and loss in RF power Hisataka Hayashi, Kazuhiro Tomioka, Itsuko Sakai, Akihiro Kojima 2004-08-24
6689699 Method for manufacturing a semiconductor device using recirculation of a process gas Itsuko Sakai, Takayuki Sakai 2004-02-10
6576562 Manufacturing method of semiconductor device using mask pattern having high etching resistance Junko Ohuchi, Yasuhiko Sato, Eishi Shiobara, Hisataka Hayashi, Yasunobu Onishi 2003-06-10
6433297 Plasma processing method and plasma processing apparatus Akihiro Kojima 2002-08-13
6420271 Method of forming a pattern Yasuhiko Sato, Eishi Shiobara, Motoyuki Sato, Yasunobu Onishi, Hiroshi Tomita +2 more 2002-07-16
6369423 Semiconductor device with a thin gate stack having a plurality of insulating layers Jeffrey P. Gambino, Katsuya Okumura, Jun-ichi Shiozawa 2002-04-09