RP

Raghuveer R. Patlolla

IBM: 45 patents #1,982 of 70,183Top 3%
TE Tessera: 3 patents #129 of 271Top 50%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
📍 Albany, NY: #28 of 790 inventorsTop 4%
🗺 New York: #1,918 of 115,490 inventorsTop 2%
Overall (All Time): #56,137 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 26–49 of 49 patents

Patent #TitleCo-InventorsDate
10686126 Back end of line metallization structures Joseph F. Maniscalco, Cornelius Brown Peethala, Chih-Chao Yang 2020-06-16
10685876 Liner and cap structures for reducing local interconnect vertical resistance without compromising reliability Su Chen Fan, Hemanth Jagannathan, Cornelius Brown Peethala 2020-06-16
10672707 Low aspect ratio interconnect Benjamin D. Briggs, Elbert E. Huang, Cornelius Brown Peethala, David L. Rath, Chih-Chao Yang 2020-06-02
10559530 Forming dual metallization interconnect structures in single metallization level Hari Prasad Amanapu, Charan V. Surisetty 2020-02-11
10461248 Bottom electrode for MRAM applications Prasad Bhosale, Michael Rizzolo, Chih-Chao Yang 2019-10-29
10373867 Cobalt contact and interconnect structures Hari Prasad Amanapu, Cornelius Brown Peethala, Chih-Chao Yang 2019-08-06
10373909 Selective surface modification of interconnect structures Cornelius Brown Peethala, Roger A. Quon, Chih-Chao Yang 2019-08-06
10242872 Rework of patterned dielectric and metal hardmask films John C. Arnold, Prasad Bhosale, Donald F. Canaperi, Cornelius Brown Peethala, Hosadurga Shobha +1 more 2019-03-26
10211153 Low aspect ratio interconnect Benjamin D. Briggs, Elbert E. Huang, Cornelius Brown Peethala, David L. Rath, Chih-Chao Yang 2019-02-19
10204829 Low-resistivity metallic interconnect structures with self-forming diffusion barrier layers Hari Prasad Amanapu, Cornelius Brown Peethala, Chih-Chao Yang, Takeshi Nogami 2019-02-12
10177030 Cobalt contact and interconnect structures Hari Prasad Amanapu, Cornelius Brown Peethala, Chih-Chao Yang 2019-01-08
10096769 Bottom electrode for MRAM applications Prasad Bhosale, Michael Rizzolo, Chih-Chao Yang 2018-10-09
10002831 Selective and non-selective barrier layer wet removal Benjamin D. Briggs, Elbert E. Huang, Cornelius Brown Peethala, David L. Rath, Hosadurga Shobha 2018-06-19
9934980 Rework and stripping of complex patterning layers using chemical mechanical polishing Jassem A. Abdallah, Brown C. Peethala 2018-04-03
9881833 Barrier planarization for interconnect metallization Benjamin D. Briggs, Elbert E. Huang, Takeshi Nogami, Cornelius Brown Peethala, David L. Rath 2018-01-30
9859218 Selective surface modification of interconnect structures Cornelius Brown Peethala, Roger A. Quon, Chih-Chao Yang 2018-01-02
9837350 Semiconductor interconnect structure with double conductors Benjamin D. Briggs, Takeshi Nogami 2017-12-05
9806023 Selective and non-selective barrier layer wet removal Benjamin D. Briggs, Elbert E. Huang, Cornelius Brown Peethala, David L. Rath, Hosadurga Shobha 2017-10-31
9685406 Selective and non-selective barrier layer wet removal Benjamin D. Briggs, Elbert E. Huang, Cornelius Brown Peethala, David L. Rath, Hosadurga Shobha 2017-06-20
9666529 Method and structure to reduce the electric field in semiconductor wiring interconnects Elbert E. Huang, Takeshi Nogami, Christopher J. Penny, Theodorus E. Standaert 2017-05-30
9640514 Wafer bonding using boron and nitrogen based bonding stack Wei Lin, Troy L. Graves-Abe, Donald F. Canaperi, Spyridon Skordas, Matthew T. Shoudy +2 more 2017-05-02
9379057 Method and structure to reduce the electric field in semiconductor wiring interconnects Elbert E. Huang, Takeshi Nogami, Christopher J. Penny, Theodorus E. Standaert 2016-06-28
9275874 Methods for fabricating integrated circuits using chemical mechanical planarization to recess metal Kunaljeet Tanwar, Xunyuan Zhang, Donald F. Canaperi 2016-03-01
9190285 Rework and stripping of complex patterning layers using chemical mechanical polishing Jassem A. Abdallah, Brown C. Peethala 2015-11-17