CS

Charan V. Surisetty

IBM: 75 patents #933 of 70,183Top 2%
Globalfoundries: 6 patents #578 of 4,424Top 15%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
TE Tessera: 1 patents #207 of 271Top 80%
Overall (All Time): #21,431 of 4,157,543Top 1%
82
Patents All Time

Issued Patents All Time

Showing 25 most recent of 82 patents

Patent #TitleCo-InventorsDate
12237328 Minimizing shorting between FinFET epitaxial regions Kangguo Cheng, Balasubramanian Pranatharthiharan, Alexander Reznicek 2025-02-25
12237368 Semiconductor structures including middle-of-line (MOL) capacitance reduction for self-aligned contact in gate stack Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2025-02-25
11664375 Minimizing shorting between FinFET epitaxial regions Kangguo Cheng, Balasubramanian Pranatharthiharan, Alexander Reznicek 2023-05-30
11038055 Method and structure of improving contact resistance for passive and long channel devices Injo Ok, Soon-Cheon Seo, Balasubramanian Pranatharthiharan 2021-06-15
11037875 Forming dual metallization interconnect structures in single metallization level Hari Prasad Amanapu, Raghuveer R. Patlolla 2021-06-15
11031337 Forming dual metallization interconnect structures in single metallization level Hari Prasad Amanapu, Raghuveer R. Patlolla 2021-06-08
11011429 Minimize middle-of-line contact line shorts Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2021-05-18
10896816 Silicon residue removal in nanosheet transistors Zhenxing Bi, Thamarai S. Devarajan, Nicolas Loubet, Binglin Miao, Muthumanickam Sankarapandian +2 more 2021-01-19
10804159 Minimize middle-of-line contact line shorts Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2020-10-13
10629721 Contact resistance reduction for advanced technology nodes Injo Ok, Balasubramanian Pranatharthiharan 2020-04-21
10559654 Nanosheet isolation for bulk CMOS non-planar devices Balasubramanian Pranatharthiharan, Injo Ok, Soon-Cheon Seo 2020-02-11
10559530 Forming dual metallization interconnect structures in single metallization level Hari Prasad Amanapu, Raghuveer R. Patlolla 2020-02-11
10490454 Minimize middle-of-line contact line shorts Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-11-26
10396200 Method and structure of improving contact resistance for passive and long channel devices Injo Ok, Soon-Cheon Seo, Balasubramanian Pranatharthiharan 2019-08-27
10381458 Semiconductor device replacement metal gate with gate cut last in RMG Andrew M. Greene, Balasubramanian Pranatharthi Haran, Injo Ok 2019-08-13
10361203 FET trench dipole formation Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-07-23
10355080 Semiconductor structures including middle-of-line (MOL) capacitance reduction for self-aligned contact in gate stack Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-07-16
10347633 Spacer for trench epitaxial structures Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-07-09
10347632 Forming spacer for trench epitaxial structures Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-07-09
10347628 Simultaneously fabricating a high voltage transistor and a FinFET Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2019-07-09
10276569 Minimizing shorting between FinFET epitaxial regions Kangguo Cheng, Balasubramanian Pranatharthiharan, Alexander Reznicek 2019-04-30
10256296 Middle-of-line (MOL) capacitance reduction for self-aligned contact in gate stack Injo Ok, Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2019-04-09
10249624 Semiconductor structure containing low-resistance source and drain contacts Injo Ok, Balasubramanian Pranatharthiharan 2019-04-02
10243044 FinFETs with high quality source/drain structures Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2019-03-26
10229852 Self-aligned low dielectric constant gate cap and a method of forming the same Balasubramanian Pranatharthiharan, Injo Ok 2019-03-12